Microscopy upgrade for EPIC
- Credit: EPIC Centre
EPIC has extended its partnership with Nikon Metrology by upgrading its Scanning Electron Micron (SEM) system.
The move sees EPIC invest in an EDS (elemental analysis device) system, tilt and rotation motor-drive and a fully automated sputter coater.
This capability is added to the Nikon 6000 Plus SEM system that offers up to x 60,000 magnification.
This extended capability was installed by a Nikon engineer during which training was delivered to tenants such as Bay Photonics, EFFECT Photonics and Palomar.
This initiative is part of EPIC’s commitment to offer the technical capabilities needed to grow businesses within the microelectronics and photonics sector.
Centre director Wayne Loschi said: “We have listened to the needs of the businesses here at EPIC and continued to grow our technical capability accordingly.
"The partnership with Nikon will see ongoing training delivered at EPIC for our tenants.
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